Hamers Group Publications

Export 282 results:
Author Title [ Type(Desc)] Year
Book Chapter
Hamers RJ. Immobilization of biomolecules at semiconductor surfaces. In: Tao F, Bernasek S. Functionalization of semiconductor surfaces. J. Wiley and Sons; 2011.
Hamers RJ, Wang X, Franking R, Ruther R, Stavis CS. Infrared spectroscopy for characterization of biomolecular interfaces. In: Pradier CM, Chabal Y. Biointerface characterization by advanced IR spectroscopy. Elsevier Press; 2011.
Hamers RJ. Integrating biological molecules with Group IV semiconductors for bioelectronic sensing. In: Katz E, Willner I. Bioelectronics: Theory and application. VCH Publishers; 2004.
Banfield JF, Hamers RJ. Processes at minerals and surfaces with relevance to microorganisms and prebiotic synthesis. In: Banfield JF, Nealson KH. Geomicrobiology: Interactions between Microbes and Minerals [Internet]. Washington: Mineralogical Soc America; 1997. pp. 81-122. <Go to ISI>://A1997BJ74J00003
Hamers RJ. Scanning tunneling microscopy. In: Chiarotti G. Physics of Solid Surfaces. Landolt-Bornstein; 1989.
Hamers RJ, Koch RH. Scanning tunneling microscopy and spectrosocpy of Si dangling bond defects. In: Helms CR. Physical and chemistry of SiO2 and the Si-SiO2 Interface. Plenum Press; 1989.
Tromp RM, Vanloenen EJ, Hamers RJ, Demuth JE. Scanning tunneling microscopy of semiconductor surfaces and interfaces. In The Structure of Surfaces II. 1988.
Hamers RJ. Scanning tunneling microscopy on semiconductors. In: Wiesendanger R. Scanning Tunneling Microscopy. Springer-Verlag; 1992.
Bonnell D. Tunneling Spectroscopy. In Scanning Tunneling Microscopy. VCH Publishers; 1993.
Conference Proceedings
Tromp R, Vanloenen EJ, Hamers RJ, Demuth JE. Scanning tunneling microscopy of semiconductor surfaces and interfaces. Second international conference on the structure of surfaces. 1987.
Journal Article
Alerhand OL, Berker AN, Joannopoulos JD, Vanderbilt D, Hamers RJ, Demuth JE. 1ST-ORDER TRANSITIONS BETWEEN SURFACE PHASES WITH DIFFERENT STEP STRUCTURES - REPLY. Physical Review Letters [Internet]. 1991;66:962-962. <Go to ISI>://A1991EX57800035
Bronikowski MJ, Wang YJ, McEllistrem MT, Chen D, Hamers RJ. ADSORPTION AND DISSOCIATION OF DISILANE ON SI(001) STUDIED BY STM. Surface Science [Internet]. 1993;298:50-62. <Go to ISI>://A1993ML07900013
Shan J, Wang YJ, Hamers RJ. Adsorption and dissociation of phosphine on Si(001). Journal of Physical Chemistry [Internet]. 1996;100:4961-4969. <Go to ISI>://A1996UB16200041
Schwartz MP, Barlow DE, Russell JN, Butler JE, D'Evelyn MP, Hamers RJ. Adsorption of acrylonitrile on diamond and silicon (001)-(2 x 1) surfaces: Effects of dimer structure on reaction pathways and product distributions. Journal of the American Chemical Society [Internet]. 2005;127:8348-8354. <Go to ISI>://000229751100042
Ellison MD, Hamers RJ. Adsorption of phenyl isothiocyanate on Si(001): A 1,2-dipolar surface addition reaction. Journal of Physical Chemistry B [Internet]. 1999;103:6243-6251. <Go to ISI>://000081813700013
Chen XX, Frank ER, Hamers RJ. ADSORPTION OF SULFUR AND 1,3-BUTANEDIOL ON SILVER THIN-FILMS USING ATOMIC RESOLUTION-REDUCED-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films [Internet]. 1994;12:2091-2096. <Go to ISI>://A1994NZ03200052
Zhu D, Bandy JA, Li S, Hamers RJ. Amino-terminated diamond surfaces: Photoelectron emission and photocatalytic properties. Surface Science [Internet]. 2016;: - . http://www.sciencedirect.com/science/article/pii/S0039602816000091
Zhang XW, Meng F, Mao S, Ding Q, Shearer MJ, Faber MS, et al. Amorphous MoSxCly electrocatalyst supported by vertical graphene for efficient electrochemical and photoelectrochemical hydrogen generation. Energy & Environmental Science [Internet]. 2015;8:862-868. <Go to ISI>://WOS:000352274600011
Bronikowski MJ, Wang YJ, Hamers RJ. ANTIPHASE BOUNDARIES AS NUCLEATION CENTERS IN LOW-TEMPERATURE SILICON EPITAXIAL-GROWTH. Physical Review B [Internet]. 1993;48:12361-12364. <Go to ISI>://A1993ME60100113
Morin SA, La YH, Liu CC, Streifer JA, Hamers RJ, Nealey PF, et al. Assembly of Nanocrystal Arrays by Block-Copolymer-Directed Nucleation. Angewandte Chemie-International Edition [Internet]. 2009;48:2135-2139. <Go to ISI>://000264411800017
Tromp RM, Hamers RJ, Demuth JE. ATOMIC AND ELECTRONIC CONTRIBUTIONS TO SI(111)-(7X7) SCANNING-TUNNELING-MICROSCOPY IMAGES. Physical Review B [Internet]. 1986;34:1388-1391. <Go to ISI>://A1986D348400126
Hamers RJ, Markert K. ATOMICALLY RESOLVED CARRIER RECOMBINATION AT SI(111)-(7X7) SURFACES. Physical Review Letters [Internet]. 1990;64:1051-1054. <Go to ISI>://A1990CQ14100018
Bronikowski MJ, Hamers RJ. ATOMICALLY RESOLVED SCANNING-TUNNELING-MICROSCOPY STUDY OF THE ADSORPTION AND DISSOCIATION OF METHYLCHLORIDE ON SI(001). Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films [Internet]. 1995;13:777-781. <Go to ISI>://A1995RD76600054
Wang YJ, Bronikowski MJ, Hamers RJ. AN ATOMICALLY RESOLVED SCANNING-TUNNELING-MICROSCOPY STUDY OF THE THERMAL-DECOMPOSITION OF DISILANE ON SI(001). Surface Science [Internet]. 1994;311:64-100. <Go to ISI>://A1994NL43100017
Wang YJ, Bronikowski MJ, Hamers RJ. AN ATOMICALLY RESOLVED STM STUDY OF THE INTERACTION OF PHOSPHINE WITH THE SILICON(001) SURFACE. Journal of Physical Chemistry [Internet]. 1994;98:5966-5973. <Go to ISI>://A1994NQ72500025
Hamers RJ, Chen X, Frank ER, Higgins SR, Shan J, Wang Y. Atomically-resolved investigations of surface reaction chemistry by scanning tunneling microscopy. Israel Journal of Chemistry [Internet]. 1996;36:11-24. <Go to ISI>://A1996VN29900003
Hamers RJ, Wang YJ. Atomically-resolved studies of the chemistry and bonding at silicon surfaces. Chemical Reviews [Internet]. 1996;96:1261-1290. <Go to ISI>://A1996UU36100004
Hamers RJ, Wang YJ, Shan J. Atomic-level spatial distributions of dopants on silicon surfaces: Toward a microscopic understanding of surface chemical reactivity. Applied Surface Science [Internet]. 1996;107:25-34. <Go to ISI>://A1996VV19700006
Chen X, Frank ER, Hamers RJ. AN ATOMIC-RESOLUTION CRYOGENIC SCANNING TUNNELING MICROSCOPE. Review of Scientific Instruments [Internet]. 1994;65:3373-3377. <Go to ISI>://A1994PT16400009
Wang YJ, Chen XX, Hamers RJ. ATOMIC-RESOLUTION STUDY OF OVERLAYER FORMATION AND INTERFACIAL MIXING IN THE INTERACTION OF PHOSPHORUS WITH SI(001). Physical Review B [Internet]. 1994;50:4534-4547. <Go to ISI>://A1994PD75300033
Hamers RJ. ATOMIC-RESOLUTION SURFACE SPECTROSCOPY WITH THE SCANNING TUNNELING MICROSCOPE. Annual Review of Physical Chemistry [Internet]. 1989;40:531-559. <Go to ISI>://A1989AY22000019
Hamers RJ. ATOMIC-SCALE IMAGING WITH THE SCANNING TUNNELING MICROSCOPE. Mrs Bulletin [Internet]. 1991;16:22-26. <Go to ISI>://A1991FD77800004
Wang YJ, Hamers RJ, Kaxiras E. ATOMIC-STRUCTURE AND BONDING OF BORON-INDUCED RECONSTRUCTIONS ON SI(001). Physical Review Letters [Internet]. 1995;74:403-406. <Go to ISI>://A1995QB16400017
Hamers RJ, Demuth JE. ATOMIC-STRUCTURE AND BONDING OF SI(111)-(SQUARE-ROOT-3XSQUARE-ROOT-3)AL. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films [Internet]. 1988;6:512-516. <Go to ISI>://A1988M650200080
Gonzalez-Moreno R, Cook PL, Zegkinoglou I, Liu XS, Johnson PS, Yang WL, et al. Attachment of Protoporphyrin Dyes to Nanostructured ZnO Surfaces: Characterization by Near Edge X-ray Absorption Fine Structure Spectroscopy. Journal of Physical Chemistry C. 2011;115:18195-18201.
Hamers RJ. Bond breaking at surfaces: Electrons or phonons?. Surface Science [Internet]. 2005;583:1-3. <Go to ISI>://000229423500001
Cao XP, Coulter SK, Ellison MD, Liu HB, Liu JM, Hamers RJ. Bonding of nitrogen-containing organic molecules to the silicon(001) surface: The role of aromaticity. Journal of Physical Chemistry B [Internet]. 2001;105:3759-3768. <Go to ISI>://000168624400013
Kapilashrami M, Conti G, Zegkinoglou I, Nemsak S, Conlon CS, Torndahl T, et al. Boron Doped diamond films as electron donors in photovoltaics: An X-ray absorption and hard X-ray photoemission study. Journal of Applied Physics [Internet]. 2014;116. <Go to ISI>://WOS:000343988000019
Wang YJ, Hamers RJ. BORON-INDUCED MORPHOLOGY CHANGES IN SILICON CHEMICAL-VAPOR-DEPOSITION - A SCANNING-TUNNELING-MICROSCOPY STUDY. Applied Physics Letters [Internet]. 1995;66:2057-2059. <Go to ISI>://A1995QT72800016
Wang YJ, Hamers RJ. BORON-INDUCED RECONSTRUCTIONS OF SI(001) INVESTIGATED BY SCANNING-TUNNELING-MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films [Internet]. 1995;13:1431-1437. <Go to ISI>://A1995RD76700039

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