Hamers Group Publications

Export 282 results:
Author Title Type [ Year(Asc)]
1996
Hamers RJ, Chen X, Frank ER, Higgins SR, Shan J, Wang Y. Atomically-resolved investigations of surface reaction chemistry by scanning tunneling microscopy. Israel Journal of Chemistry [Internet]. 1996;36:11-24. <Go to ISI>://A1996VN29900003
Hamers RJ, Wang YJ. Atomically-resolved studies of the chemistry and bonding at silicon surfaces. Chemical Reviews [Internet]. 1996;96:1261-1290. <Go to ISI>://A1996UU36100004
Hamers RJ, Wang YJ, Shan J. Atomic-level spatial distributions of dopants on silicon surfaces: Toward a microscopic understanding of surface chemical reactivity. Applied Surface Science [Internet]. 1996;107:25-34. <Go to ISI>://A1996VV19700006
Higgins SR, Hamers RJ. Chemical dissolution of the galena(001) surface observed using electrochemical scanning tunneling microscopy. Geochimica Et Cosmochimica Acta [Internet]. 1996;60:3067-3073. <Go to ISI>://A1996VC98000010
Bronikowski MJ, Hamers RJ. The chemistry of gallium deposition on Si(001) from trimethylgallium: An atomically resolved STM study. Surface Science [Internet]. 1996;348:311-324. <Go to ISI>://A1996UA26200012
Wang YJ, Shan J, Hamers RJ. Combined scanning tunneling microscopy and infrared spectroscopy study of the interaction of diborane with Si(001). Journal of Vacuum Science & Technology B [Internet]. 1996;14:1038-1042. <Go to ISI>://A1996UH89000091
Hamers RJ. Eighth international conference on scanning tunneling microscopy/spectroscopy and related techniques - Preface. Journal of Vacuum Science & Technology B [Internet]. 1996;14:787-787. <Go to ISI>://A1996UH89000034
Higgins SR, Hamers RJ. Morphology and dissolution processes of metal sulfide minerals observed with the electrochemical scanning tunneling microscope. Journal of Vacuum Science & Technology B [Internet]. 1996;14:1360-1364. <Go to ISI>://A1996UH89000161
Hamers RJ. Scanned probe microscopies in chemistry. Journal of Physical Chemistry [Internet]. 1996;100:13103-13120. <Go to ISI>://A1996VA59500030
Chen X, Frank ER, Hamers RJ. Spatially and rotationally oriented adsorption of molecular adsorbates on Ag(111) investigated using cryogenic scanning tunneling microscopy. Journal of Vacuum Science & Technology B [Internet]. 1996;14:1136-1140. <Go to ISI>://A1996UH89000111
1995
Bronikowski MJ, Hamers RJ. ATOMICALLY RESOLVED SCANNING-TUNNELING-MICROSCOPY STUDY OF THE ADSORPTION AND DISSOCIATION OF METHYLCHLORIDE ON SI(001). Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films [Internet]. 1995;13:777-781. <Go to ISI>://A1995RD76600054
Wang YJ, Hamers RJ, Kaxiras E. ATOMIC-STRUCTURE AND BONDING OF BORON-INDUCED RECONSTRUCTIONS ON SI(001). Physical Review Letters [Internet]. 1995;74:403-406. <Go to ISI>://A1995QB16400017
Wang YJ, Hamers RJ. BORON-INDUCED MORPHOLOGY CHANGES IN SILICON CHEMICAL-VAPOR-DEPOSITION - A SCANNING-TUNNELING-MICROSCOPY STUDY. Applied Physics Letters [Internet]. 1995;66:2057-2059. <Go to ISI>://A1995QT72800016
Wang YJ, Hamers RJ. BORON-INDUCED RECONSTRUCTIONS OF SI(001) INVESTIGATED BY SCANNING-TUNNELING-MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films [Internet]. 1995;13:1431-1437. <Go to ISI>://A1995RD76700039
Frank ER, Chen XX, Hamers RJ. DIRECT OBSERVATION OF ORIENTED MOLECULAR ADSORPTION AT STEP EDGES - A CRYOGENIC SCANNING-TUNNELING-MICROSCOPY STUDY. Surface Science [Internet]. 1995;334:L709-L714. <Go to ISI>://A1995RK97300004
Higgins SR, Hamers RJ. SPATIALLY-RESOLVED ELECTROCHEMISTRY OF THE LEAD SULFIDE (GALENA) (001) SURFACE BY ELECTROCHEMICAL SCANNING-TUNNELING-MICROSCOPY. Surface Science [Internet]. 1995;324:263-281. <Go to ISI>://A1995QG63800021
1994
Chen XX, Frank ER, Hamers RJ. ADSORPTION OF SULFUR AND 1,3-BUTANEDIOL ON SILVER THIN-FILMS USING ATOMIC RESOLUTION-REDUCED-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films [Internet]. 1994;12:2091-2096. <Go to ISI>://A1994NZ03200052
Wang YJ, Bronikowski MJ, Hamers RJ. AN ATOMICALLY RESOLVED SCANNING-TUNNELING-MICROSCOPY STUDY OF THE THERMAL-DECOMPOSITION OF DISILANE ON SI(001). Surface Science [Internet]. 1994;311:64-100. <Go to ISI>://A1994NL43100017
Wang YJ, Bronikowski MJ, Hamers RJ. AN ATOMICALLY RESOLVED STM STUDY OF THE INTERACTION OF PHOSPHINE WITH THE SILICON(001) SURFACE. Journal of Physical Chemistry [Internet]. 1994;98:5966-5973. <Go to ISI>://A1994NQ72500025
Chen X, Frank ER, Hamers RJ. AN ATOMIC-RESOLUTION CRYOGENIC SCANNING TUNNELING MICROSCOPE. Review of Scientific Instruments [Internet]. 1994;65:3373-3377. <Go to ISI>://A1994PT16400009
Wang YJ, Chen XX, Hamers RJ. ATOMIC-RESOLUTION STUDY OF OVERLAYER FORMATION AND INTERFACIAL MIXING IN THE INTERACTION OF PHOSPHORUS WITH SI(001). Physical Review B [Internet]. 1994;50:4534-4547. <Go to ISI>://A1994PD75300033
Wang YJ, Bronikowski MJ, Hamers RJ. DIRECT DIMER-BY-DIMER IDENTIFICATION OF CLEAN AND MONOHYDRIDE DIMERS ON THE SI(001) SURFACE BY SCANNING-TUNNELING-MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films [Internet]. 1994;12:2051-2057. <Go to ISI>://A1994NZ03200045
1993
Bronikowski MJ, Wang YJ, McEllistrem MT, Chen D, Hamers RJ. ADSORPTION AND DISSOCIATION OF DISILANE ON SI(001) STUDIED BY STM. Surface Science [Internet]. 1993;298:50-62. <Go to ISI>://A1993ML07900013
Bronikowski MJ, Wang YJ, Hamers RJ. ANTIPHASE BOUNDARIES AS NUCLEATION CENTERS IN LOW-TEMPERATURE SILICON EPITAXIAL-GROWTH. Physical Review B [Internet]. 1993;48:12361-12364. <Go to ISI>://A1993ME60100113
McEllistrem M, Haase G, Chen D, Hamers RJ. ELECTROSTATIC SAMPLE-TIP INTERACTIONS IN THE SCANNING TUNNELING MICROSCOPE. Physical Review Letters [Internet]. 1993;70:2471-2474. <Go to ISI>://A1993KX81500029
Bonnell D. Tunneling Spectroscopy. In Scanning Tunneling Microscopy. VCH Publishers; 1993.
1992
Cahill DG, Hamers RJ. CHARGE DYNAMICS AT THE SILICON(001) SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPY AND SURFACE PHOTOVOLTAGE. Scanning Microscopy [Internet]. 1992;6:931-936. <Go to ISI>://A1992KK54800006
Chen X, Cousins B, McEllistrem M, Hamers RJ. HIGH-PERFORMANCE, LOW-NOISE DIGITAL CONTROLLER FOR INCHWORM PIEZOELECTRIC TRANSLATORS. Review of Scientific Instruments [Internet]. 1992;63:4308-4313. <Go to ISI>://A1992JV13200008
Hamers RJ. Scanning tunneling microscopy on semiconductors. In: Wiesendanger R. Scanning Tunneling Microscopy. Springer-Verlag; 1992.
1991
Alerhand OL, Berker AN, Joannopoulos JD, Vanderbilt D, Hamers RJ, Demuth JE. 1ST-ORDER TRANSITIONS BETWEEN SURFACE PHASES WITH DIFFERENT STEP STRUCTURES - REPLY. Physical Review Letters [Internet]. 1991;66:962-962. <Go to ISI>://A1991EX57800035
Hamers RJ. ATOMIC-SCALE IMAGING WITH THE SCANNING TUNNELING MICROSCOPE. Mrs Bulletin [Internet]. 1991;16:22-26. <Go to ISI>://A1991FD77800004
Chen CJ, Hamers RJ. ROLE OF ATOMIC FORCE IN TUNNELING-BARRIER MEASUREMENTS. Journal of Vacuum Science & Technology B [Internet]. 1991;9:503-505. <Go to ISI>://A1991FL00400020
Hamers RJ. Scanning Tunneling Microscopy. VCH Publishers; 1991.
Cahill DG, Hamers RJ. SCANNING TUNNELING MICROSCOPY OF PHOTOEXCITED CARRIERS AT THE SI(001) SURFACE. Journal of Vacuum Science & Technology B [Internet]. 1991;9:564-567. <Go to ISI>://A1991FL00400033
Cahill DG, Hamers RJ. SURFACE PHOTOVOLTAGE OF AG ON SI(111)-7X7 BY SCANNING TUNNELING MICROSCOPY. Physical Review B [Internet]. 1991;44:1387-1390. <Go to ISI>://A1991FW10500063
Hamers RJ, Cahill DG. ULTRAFAST TIME RESOLUTION IN SCANNED PROBE MICROSCOPES - SURFACE PHOTOVOLTAGE ON SI(111)-(7X7). Journal of Vacuum Science & Technology B [Internet]. 1991;9:514-518. <Go to ISI>://A1991FL00400023
1990
Hamers RJ, Markert K. ATOMICALLY RESOLVED CARRIER RECOMBINATION AT SI(111)-(7X7) SURFACES. Physical Review Letters [Internet]. 1990;64:1051-1054. <Go to ISI>://A1990CQ14100018
Hamers RJ, Kohler UK, Demuth JE. EPITAXIAL-GROWTH OF SILICON ON SI(001) BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films [Internet]. 1990;8:195-200. <Go to ISI>://A1990CL59400038
Alerhand OL, Berker AN, Joannopoulos JD, Vanderbilt D, Hamers RJ, Demuth JE. FINITE-TEMPERATURE PHASE-DIAGRAM OF VICINAL SI(100) SURFACES. Physical Review Letters [Internet]. 1990;64:2406-2409. <Go to ISI>://A1990DC93700018
Hashizume T, Hamers RJ, Demuth JE, Markert K, Sakurai T. INITIAL-STAGE DEPOSITION OF AG ON THE SI(100)2X1 SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films [Internet]. 1990;8:249-250. <Go to ISI>://A1990CL59400050

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